Mask repair with electron beam-induced chemical etching

ABSTRACT

The present invention discloses a method of fabricating and repairing a mask without damage and an apparatus including a holder to mount a substrate; a stage to position the holder in a chamber; a pumping system to evacuate the chamber; an imaging system to locate an opaque defect in the substrate; a gas delivery system to dispense a reactant gas towards the defect; and an electron delivery system to direct electrons towards the opaque defect.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] The present invention relates to the field of semiconductorintegrated circuit manufacturing, and more specifically, to a method offabricating and repairing a mask with electron beam-induced chemicaletching.

[0003] 2. Discussion of Related Art

[0004] After coating photoresist on a semiconductor wafer, a scanner maybe used to expose the photoresist to radiation, such as deep ultraviolet(DUV) light with nominal wavelength of 248 nanometers (nm), 193 nm, or157 nm. The wafer is sub-divided into contiguous identical fields and areduction projection system is used to scan light across a mask and ontoeach field. One or more integrated circuit (IC) chips is fabricated ineach field. The mask, which may be transmissive or reflective,determines the pattern to be transferred to the photoresist as a resultof the exposure followed by a develop process.

[0005] Using a Phase-Shifting Mask (PSM) and Optical ProximityCorrection (OPC) with DUV light will allow printing of features with acritical dimension (CD) of 100-180 nm. However, Next GenerationLithography (NGL) is required to print features with even smaller CD.Extreme Ultraviolet (EUV) lithography, a leading candidate for NGL, usesexposure light with a central wavelength in the range of 10-15 nm.

[0006] An EUV scanner may have 4 imaging mirrors and a NumericalAperture (NA) of 0.10 to achieve a CD of 50-70 nm with a depth of focus(DOF) of about 1.00 micrometer (um). Alternatively, an EUV scanner mayhave 6 imaging mirrors and a NA of 0.25 to print a CD of 20-30 nm with areduction in DOF to about 0.17 um.

[0007] A DUV or EUV mask is inspected for defects during fabrication.Repair of critical defects is performed with a focused ion beam (FIB)tool having a Gallium liquid metal ion source. A clear defect is coveredup by depositing Carbon or a metal, followed by trimming withgas-assisted etch (GAE). An opaque defect is repaired with physical ionsputtering or GAE with ion bombardment. The process to remove opaquedefects should have adequate etch selectivity to the underlying layer.The underlying layer is quartz in a transmissive mask for DUV or abuffer layer in a reflective mask for EUV.

[0008] FIB may damage a mask during the scan to search for defects orduring the repair of defects. The repaired portions of the mask may beroughened by sputtering. Organic contamination may be deposited on thesurface of the mask. Gallium ions may be implanted into underlyinglayers. Gallium absorbs strongly at 157 nm and at EUV wavelengths, thusdecreasing the transmission in a transmissive mask, such as a 157 nm DUVmask, or decreasing the reflectivity in a reflective mask, such as anEUV mask. Underlying layers of the mask may be further damaged byknock-on of atoms by Gallium.

[0009] Damage to a mask becomes more problematic as the CD of thefeatures on the mask shrinks. Lowering the acceleration voltage in theFIB will reduce the penetration range of Gallium ions, but etchselectivity and spatial resolution are compromised. Limiting imagingtime and overscan area can reduce damage, but repair may also beadversely affected. Post-repair treatment, such as wet etch of thequartz substrate in a 157 nm DUV mask or the buffer layer in an EUVmask, will remove implanted Gallium ions, but the underlying materialmay become pitted. If sufficient material is removed, a phase error mayalso be introduced.

[0010] Thus, what is needed is an apparatus for and a method offabricating and repairing a mask without damage.

BRIEF DESCRIPTION OF THE DRAWINGS

[0011]FIG. 1 (a)-(d) are illustrations of a cross-sectional view of anEUV mask blank formed according to the present invention.

[0012]FIG. 2 (a)-(d) are illustrations of a cross-sectional view of anEUV mask formed according to the present invention.

[0013]FIG. 3 is an illustration of a cross-sectional view of an EUV maskof the present invention.

[0014]FIG. 4 is an illustration of a cross-sectional view of anapparatus for repairing opaque defects with electron beam-inducedchemical etch according to the present invention.

DETAILED DESCRIPTION OF THE PRESENT INVENTION

[0015] In the following description, numerous details, such as specificmaterials, dimensions, and processes, are set forth in order to providea thorough understanding of the present invention. However, one skilledin the art will realize that the invention may be practiced withoutthese particular details. In other instances, well-known semiconductorequipment and processes have not been described in particular detail soas to avoid obscuring the present invention.

[0016] A mask is used in lithography to print a desired pattern inphotoresist on a wafer. Deep ultraviolet (DUV) lithography uses atransmissive mask for exposure with light having a wavelength of 248 nm,193 nm, or 157 nm. Extreme ultraviolet (EUV) lithography uses areflective mask for exposure since nearly all condensed materials arehighly absorbing in the EUV wavelength range of 11-15 nm.

[0017] The desired pattern is defined in a DUV mask by selectivelyremoving portions of an opaque Chrome layer to uncover a transparentquartz substrate. The desired pattern is defined in an EUV mask byselectively removing portions of an absorber layer to uncover amultilayer mirror on a substrate.

[0018] A DUV mask or an EUV mask is inspected for defects as part of themask fabrication process. The inspection is usually done with DUV light.A defect may appear clear or opaque. A defect is considered critical ifits size, shape, or location may significantly affect the print fidelityand quality of the mask features in the vicinity. A critical defect mustbe repaired or else the yield may be degraded on the structure beingfabricated with the mask. The present invention includes an apparatusfor and a method of repairing opaque defects on a DUV mask or an EUVmask without damage to underlying layers.

[0019] Various embodiments of a method of fabricating and repairing anEUV mask according to the present invention will be described. First, asubstrate 1100 having a low coefficient of thermal expansion (CTE), asmooth surface, and a low defect level is used as the starting materialfor an EUV mask of the present invention. An embodiment is shown in FIG.1 (a). The substrate 1100 may be formed out of a glass-ceramic materialwith the desired properties.

[0020] Second, a multilayer (ML) mirror 1200 is formed over thesubstrate 1100 since an EUV mask operates on the principle of adistributed Bragg reflector. An embodiment is shown in FIG. 1 (b). TheML mirror 1200 includes about 20-80 pairs of alternating layers of ahigh index of refraction material 1210 and a low index of refractionmaterial 1220. The thickness uniformity should be better than 0.8%across the substrate 1100.

[0021] In one embodiment, the ML mirror 1200 includes 40 pairs ofalternating layers of a high index of refraction material 1210 and a lowindex of refraction material 1220. The high index of refraction material1210 may be formed from about 2.8 nm thick Molybdenum while the lowindex of refraction material 1220 may be formed from about 4.1 nm thickSilicon. As needed, a capping layer 1230, such as about 11.0 nm thickSilicon, may be formed over the ML mirror 1200 to prevent oxidation ofMolybdenum at the upper surface of the ML mirror 1200 in an EUV mask.The ML mirror 1200 can achieve a peak reflectivity of about 60-75% atthe EUV central illumination wavelength of about 13.4 nm.

[0022] Ion beam deposition (IBD) or direct current (DC) magnetronsputtering may be used to form the ML mirror 1200 over the substrate1100. IBD results in less perturbation and fewer defects in the uppersurface of the ML mirror 1200 because the deposition conditions may beoptimized to smooth over a defect on the substrate 1100. DC magnetronsputtering is more conformal, thus producing better thicknessuniformity, but any defect on the substrate 1100 will tend to propagateup through the alternating layers to the upper surface of the ML mirror1200.

[0023] Third, a buffer layer 1300 is formed over the upper surface ofthe ML mirror 1200. An embodiment is shown in FIG. 1 (c). The bufferlayer 1300 may have a thickness of about 10-55 nm. The buffer layer 1300may be formed from Silicon Dioxide, such as a low temperature oxide(LTO). A low process temperature, typically less than about 150 degreesC., is desirable to prevent interdiffusion of the alternating layers inthe underlying ML mirror 1200. Other materials, such as SiliconOxynitride or Carbon, may be used to form the buffer layer 1300. Thebuffer layer 1300 may be deposited by Radio Frequency (RF) magnetronsputtering.

[0024] Fourth, an absorber layer 1400 is formed over the buffer layer1300. An embodiment is shown in FIG. 1 (d). The absorber layer 1400 maybe formed from about 45-125 nm of a material that will attenuate EUVlight, remain stable during exposure to EUV light, and be compatiblewith the mask fabrication process. The absorber layer 1400 may bedeposited with DC magnetron sputtering.

[0025] Various metals, alloys, and ceramics may be used to form theabsorber layer 1400. Metals include Aluminum, Chromium, Nickel,Tantalum, Titanium, and Tungsten. Alloys include compounds of metals,such as Aluminum-Copper. Ceramics include compounds of metals andnonmetals, such as borides, carbides, nitrides, oxides, phosphides,silicides, and sulfides of metals. Examples include Nickel Silicide,Tantalum Boride, Tantalum Germanium, Tantalum Nitride, TantalumSilicide, Tantalum Silicon Nitride, and Titanium Nitride.

[0026] The combination of absorber layer 1400, buffer layer 1300, MLmirror 1200, and substrate 1100 results in an EUV mask blank 1700. Anembodiment is shown in FIG. 1 (d). The EUV mask blank 1700 shown in FIG.1 (d) may be further processed to produce an EUV mask 1800, anembodiment of which is shown in FIG. 2 (d).

[0027] First, an EUV mask blank 1700 is covered with aradiation-sensitive layer, such as photoresist 1600. The photoresist1600 has a thickness of about 160-640 nm. A chemically-amplified resist(CAR) may be used. A desired pattern is formed in the photoresist 1600by selective exposure with sufficient radiation of the appropriatewavelength, such as DUV light or electron beam, followed by a wet or drydevelop process. An embodiment is shown in FIG. 2 (a). After developingthe pattern in the photoresist 1600, the critical dimension (CD) of thefeatures is measured with an optical tool or a scanning electronmicroscope (SEM).

[0028] Reactive ion etch (RIE) may be used to transfer the pattern fromthe photoresist 1600 into the underlying absorber layer 1400. Forexample, an absorber layer 1400 may be dry etched with a gas containingChlorine, such as Cl₂ or BCl₃, or with a gas containing Fluorine, suchas NF3. Argon may be used as a carrier gas. In some cases, Oxygen may beincluded. The etch rate and the etch selectivity may be changed bymodifying the configuration of the reactor chamber and adjustingparameters such as power, pressure, substrate temperature, and gasflowrate.

[0029] The buffer layer 1300 serves as an etch stop layer to helpproduce a good etch profile in the overlying absorber layer 1400.Furthermore, the buffer layer 1300 protects the underlying ML mirror1200 from damage during the etch of the overlying absorber layer 1400.The buffer layer 1300 also protects the underlying ML mirror 1200 fromdamage during any subsequent repair to remove opaque defects in theabsorber layer 1400.

[0030] After completing the etch, the photoresist 1600 is removed andthe CD of the features formed in the absorber layer 1400 is measuredwith an optical tool or with a scanning electron microscope (SEM).Whenever appropriate, an interferometer may be used to measure the phaseof the light signals in addition to the amplitude. Then the mask isinspected for defects with a microscope or an automated inspection tool.The mask inspection tools may combine optical techniques with scanningof the mask to acquire images. A laser producing UV/DUV light is usuallyused as the source of illumination. Typical wavelengths include, but arenot limited to, 488 nm, 365 nm, 266 nm, 257 nm, 248 nm, 198 nm, and 193nm. A shorter wavelength provides better resolution and may be a betterpredictor of the lithographic consequences of the defects that are foundon the mask.

[0031] Defect inspection is generally performed by comparing twonominally identical patterns printed in different portions of a mask(die-to-die) or comparing a pattern printed on the mask and thecorresponding layout data for the pattern (die-to-database). A defectmay be found in the absorber layer 1400 after pattern transfer from thephotoresist 1600. The defect may appear as a clear defect 1710 or as anopaque defect 1720. An embodiment is shown in FIG. 2 (b). In a cleardefect 1710, the absorber layer 1400 should be present, but it iscompletely or partially missing. In an opaque defect 1720, the absorberlayer 1400 should be absent, but it is completely or partially present.

[0032] A focused ion beam (FIB) tool may be used to cover a clear defect1710 with an opaque material 1730, such as Carbon. A clear defect mayalso be repaired by ion beam-induced metal deposition fromorganometallic precursor gases. For example, Tungsten may be depositedfrom Tungsten Hexacarbonyl or W(CO)₆ gas. A post-deposition trim withgas-assisted etch (GAE) may be performed to eliminate any overspray andto achieve the desired post-repair size for the opaque material 1730.Bromine gas or Chlorine gas may be used in the GAE. The deposited opaquematerial 1730 need not have the same thickness as the chrome on atransmissive mask or the absorber layer 1400 on a reflective mask. Thedeposited opaque material 1730 should be compatible with the chemicalsused to clean the mask.

[0033] The present invention envisions using electron beam-inducedchemical etching to repair an opaque defect 1720 on a DUV mask or an EUVmask. Electron beam-induced chemical etching has high selectivity tounderlying layers because it is essentially chemical, unlike FIB or GAE,which always have a physical component due to the ion bombardment.Unlike with the ion beam in FIB, an electron beam will not damageunderlying layers by ion implantation or by knock-on of atoms. Anembodiment is shown in FIG. 2 (c).

[0034] In an EUV mask, a buffer layer 1300 covers and protects the MLmirror 1200 from damage during repair of the overlying absorber layer1400. The thickness required for the buffer layer 1300 depends on thequantity of material that will be removed by the repair process.Consequently, a high etch selectivity allows the use of a thin bufferlayer 1300 on an EUV mask. A thin buffer layer 1300 results in a loweroverall absorber stack that reduces shadowing and improves imaging. Athin buffer layer 1300 also reduces the chances of generating printablesoft defects during the removal of the buffer layer 1300 aftercompletion of repair.

[0035] The buffer layer 1300 will increase light absorption over the MLmirror 1200 when the EUV mask 1800 is used to expose photoresist on awafer. The result is a reduction in contrast that will slightly degradeCD control of the features printed in the photoresist on a wafer. Inorder to prevent this degradation, the buffer layer 1300 is removedwherever it is not covered by the absorber layer 1400.

[0036] The overlying absorber layer 1400 and the underlying ML mirror1200 must not be damaged when the exposed portions of the buffer layer1300 are removed. A buffer layer 1300 formed from Silicon Dioxide may bedry etched with a gas containing Fluorine, such as CF₄ or C₅F₈. In somecases, Oxygen and a carrier gas, such as Argon, may be included.Alternatively, a thin buffer layer 1300 may be wet etched since anyundercut of the absorber layer 1400 would then be small. For example, abuffer layer 1300 formed from Silicon Dioxide may be etched with anaqueous solution of about 3-5% hydrofluoric acid. A combination of dryetch and wet etch may be used if desired.

[0037] The result of the process described above is an EUV mask 1800having a reflective region 1750 and an anti-reflective, or dark, region1760. An embodiment is shown in FIG. 2 (d).

[0038] Another embodiment of the present invention is an EUV mask 2700as shown in FIG. 3. An EUV mask 2700 includes an absorber layer 2400, athin buffer layer 2300, an ML mirror 2200, and a substrate 2100. The EUVmask 2700 has a first region 2750 and a second region 2760. The firstregion 2750 is reflective because the ML mirror 2200 is uncovered. Thesecond region 2760 is anti-reflective, or dark, due to the absorberlayer 2400.

[0039] First, the EUV mask 2700 of the present invention includes asubstrate 2100, such as a glass-ceramic material, that has a lowcoefficient of thermal expansion (CTE), a low defect level, and a smoothsurface.

[0040] Second, a multilayer (ML) mirror 2200 is disposed over thesubstrate 2100. The ML mirror 2200 has about 20-80 pairs of alternatinglayers of a high index of refraction material 2210 and a low index ofrefraction material 2220.

[0041] In one embodiment, the ML mirror 2200 includes 40 pairs of a highindex of refraction material 2210 and a low index of refraction material2220. The high index of refraction material 2210 may be about 2.8 nmthick Molybdenum while the low index of refraction material 2220 may beabout 4.1 nm thick Silicon. The ML mirror 2200 has a peak reflectivityof about 60-75% at a central illumination wavelength of about 13.4 nm.

[0042] Third, an ultrathin buffer layer 2300 is disposed over the MLmirror 2200. The ultrathin buffer layer 2300 is about 10-55 nm thick.The ultrathin buffer layer 2300 protects the underlying ML mirror 2200from any damage during the etch of the overlying absorber layer 2400.The ultrathin buffer layer 2300 also protects the underlying ML mirror2200 from damage during repair to remove opaque defects.

[0043] The ultrathin buffer layer 2300 may be Silicon Dioxide, such as alow temperature oxide (LTO). Other materials, such as Silicon Oxynitrideor Carbon may also be used for the ultrathin buffer layer 2300.

[0044] Fourth, an absorber layer 2400 is disposed over the ultrathinbuffer layer 2300. The absorber layer 2400 may be about 45-125 nm of amaterial that will attenuate EUV light, remain stable during exposure toEUV light, and be compatible with the mask fabrication process.

[0045] The absorber layer 2400 may include one or more metals, alloys,and ceramics. Metals include Aluminum, Chromium, Nickel, Niobium,Tantalum, Titanium, and Tungsten. Alloys include compounds of metals,such as Alumninum-Copper. Ceramics are compounds formed from metals andnonmetals, such as borides, carbides, nitrides, oxides, or suicides ofvarious metals. Examples include Nickel Silicide, Tantalum Boride,Tantalum Germanium, Tantalum Nitride, Tantalum Silicide, TantalumSilicon Nitride, and Titanium Nitride.

[0046] The present invention further envisions an apparatus 400 torepair an opaque defect 405 on a DUV or EUV mask 410, by using electronbeam-induced chemical etching. An embodiment is shown in FIG. 4.

[0047] In the apparatus 400 claimed in the present invention, a mask 410to be repaired is mounted on a holder 420. The holder 420 is positionedin a chamber 470 by a stage 430. The stage 430 can rotate, tilt, andmove in different directions, such as along the x-axis, y-axis, andz-axis. An imaging system 440 is used to locate an opaque defect 405 onthe mask 410. The imaging system 440 may include an electron column.

[0048] A gas delivery system 450 dispenses one or more gases fromreservoirs towards the opaque defect 405 on the substrate 410 in thechamber 470. The gases may be fed through one or more openings, such asnozzles, into the chamber 470. The desired flowrates are maintained byadjusting flow control valves.

[0049] Critical parameters include nozzle dimensions, tilt angle fromnozzle to mask, angular dispersion of gas dispensed, and distance fromthe opening of the nozzle opening to the surface of the mask. Typicalvalues include, but are not limited to, 100-300 microns (um) for nozzlediameter, 45-70 degrees (from vertical) for nozzle tilt angle, 5-25degrees for angular dispersion, and 50-150 um for distance from thenozzle opening to the mask surface.

[0050] The gases may include reactant gases and carrier gases. Thechoice of reactant gases depends on the materials to be etched. In oneembodiment of the present invention, the reactant gases adsorb to theopaque defect 405 and become dissociated. Argon is an example of acarrier gas.

[0051] In a DUV transmissive mask 410, an opaque defect 405 may includematerials such as chrome, chrome oxide, chrome nitride, or chromeoxynitride. The underlying layer may include quartz. An electrondelivery system 460 may be used to induce a reactant gas, such aschlorine (Cl₂) and oxygen (O₂), to chemically etch the opaque defect 405relative to the underlying layer with a selectivity of 2:1 or more.

[0052] In an EUV reflective mask 410, an opaque defect 405 may includeabsorber layer material such as Tantalum Nitride. The underlying layermay include buffer layer material such as Silicon Dioxide. An electrondelivery system 460 may be used to induce a reactant gas, such as XenonFluoride (XeF₂) or Carbon Tetrafluoride (CF₄) or Fluorine (F₂), tochemically etch the opaque defect 405 relative to the underlying layerwith a selectivity of 10:1 or more. Volatile byproducts, such asTantalum Fluoride, may be removed from the chamber 470 by a pumpingsystem 480.

[0053] When an opaque defect 405 includes a Carbon-containing material,an electron delivery system 460 may be used to induce a reactant gas,such as water vapor (H₂O) or Oxygen (O₂), to chemically etch the opaquedefect 405 relative to the underlying layer with a selectivity of 10:1or more. For example, a Carbon etch may be used to repair an opaquedefect 405 on an EUV mask 410 that has a conductive buffer layercontaining Carbon. A Carbon etch may also be used to repair an opaquedefect 405 in a photoresist pattern on a mask 410 to increase thepatterning yield and to reduce rework. Furthermore, a Carbon etch may behelpful in the more difficult repair that is required after a mask 410has gone through additional processing.

[0054] The electron delivery system 460 used to induce chemical etchingmay resemble an electron column used to image a sample in a SEM exceptthat the focusing and scanning controls for the electron beam are moresophisticated. In particular, critical parameters, such as beam current,pixel spacing, dwell time, scan rate, refresh time, and retrace time,may be controlled by a computer to optimize etch rate, etch geometry,etch uniformity, and surface roughness.

[0055] The electron delivery system 460 directs electrons towards theopaque defect 405 on the mask 410 in the chamber 470. The electrondelivery system 460 may include a focusing system to provide a highlyfocused electron beam. In one embodiment, highly focused means that theelectron beam size is smaller than the range of the secondary electrons.In another embodiment, highly focused means that the electron beam sizeis smaller than about 30% of the size of the smallest critical defect tobe repaired. In general, an electron beam has a typical tail diameter ofabout 5-125 nm.

[0056] The electron delivery system 460 uses a low acceleration voltage,such as in the range of 0.3-3.0 keV, to limit the lateral spread ofemitted electrons at the surface of the mask 410. A low voltage alsominimizes surface charging. The emitted electrons include secondaryelectrons and backscattered electrons. A chemical etch of an opaquedefect 405 is induced when secondary electrons interact with thereactant gas that is adsorbed and dissociated on the surface of the mask410. If desired, the secondary electron current may be monitored todetect the etch endpoint.

[0057] In most cases, the electron beam-induced chemical etch isreaction-limited and not mass transfer-limited. The chemical etching ofthe opaque defect 405 by the reactant gas produces volatile byproductsthat dissociate from the mask and may be removed from the chamber 470holding the mask 410. A pumping system 480 evacuates gases and volatilematerials from the chamber 470, thus creating a vacuum inside thechamber 470.

[0058] The electron beam-induced chemical etch rate of the opaque defect405 depends on the partial pressure of the reactant gas and the currentdensity of the electron beam. The pressure in the chamber 470 may beabout 0.001-0.200 milliTorr (mT) globally and about 0.500-10.000 mTlocally over the opaque defect 405 being repaired on the mask 405. Thebeam current may be about 0.050-1.000 nanoAmperes (nA). The electronbeam-induced chemical etch rate usually depends on the yield of thesecondary electrons. The etch rate is usually at a maximum for anacceleration voltage of about 1.0 keV or less.

[0059] Many embodiments and numerous details have been set forth abovein order to provide a thorough understanding of the present invention.One skilled in the art will appreciate that many of the features in oneembodiment are equally applicable to other embodiments. One skilled inthe art will also appreciate the ability to make various equivalentsubstitutions for those specific materials, processes, dimensions,concentrations, etc. described herein. It is to be understood that thedetailed description of the present invention should be taken asillustrative and not limiting, wherein the scope of the presentinvention should be determined by the claims that follow.

[0060] Thus, we have described an apparatus for and a method offabricating and repairing a mask without damage.

We claim:
 1. An apparatus comprising: a holder adapted to mount asubstrate; a stage adapted to position said holder in a chamber; apumping system adapted to evacuate said chamber; an imaging systemadapted to locate an opaque defect in said substrate; a gas deliverysystem adapted to dispense a reactant gas towards said defect; and anelectron delivery system adapted to direct electrons towards said opaquedefect.
 2. The apparatus of claim 1 wherein said imaging systemcomprises an electron column.
 3. The apparatus of claim 1 wherein saidelectron delivery system comprises an electron column.
 4. The apparatusof claim 1 wherein said substrate comprises a transmissive DUV mask. 5.The apparatus of claim 1 wherein said opaque defect comprises chrome andsaid reactant gas comprises chlorine and oxygen.
 6. The apparatus ofclaim 1 wherein said substrate comprises a reflective EUV mask.
 7. Theapparatus of claim 1 wherein said opaque defect comprises an absorberand said reactant gas comprises Xenon Fluoride (XeF₂).
 8. The apparatusof claim 1 wherein said opaque defect comprises Carbon and said reactantgas comprises water vapor or oxygen.
 9. The apparatus of claim 1 furthercomprising a focusing system adapted to highly focus said electrons onsaid opaque defect.
 10. The apparatus of claim 1 further comprising ascanning system adapted to scan said electrons across said opaquedefect.
 11. The apparatus of claim 1 further comprising an accelerationsystem adapted to provide a low acceleration voltage for said electrons.12. The apparatus of claim 1 further comprising a computer adapted tocontrol said electron delivery system.
 13. A method comprising:providing a substrate; forming a layer over said substrate; patterningsaid layer into a first region and a second region; removing said layerin said first region; inspecting said first region for an opaque defect;forming a reactant gas over said opaque defect; and directing electronstoward said opaque defect, said electrons inducing said reactant gas toetch said opaque defect.
 14. The method of claim 13 wherein saidreactant gas etches said opaque defect without damage to said substrate.15. The method of claim 13 wherein said opaque defect comprises chromeand said reactant gas comprises chlorine and oxygen.
 16. A methodcomprising: providing a substrate; forming a mirror over said substrate;forming a buffer layer over said mirror; forming an absorber layer oversaid buffer layer; patterning said absorber layer into a first regionand a second region; removing said absorber layer in said first region;inspecting said first region for an opaque defect; dispensing a reactantgas over said opaque defect; scanning an electron beam over said opaquedefect, said electron beam inducing said reactant gas to react with saidopaque defect to form a volatile byproduct; and removing said bufferlayer in said first region.
 17. The method of claim 16 wherein saidopaque defect comprises an absorber and said reactant gas comprisesXenon Fluoride (XeF₂).